This is to advise you that a Design and/or Process Change will be made to the following High Reliability product(s):

Product ID (Description):
Logic Family: FAST PRODUCTS

Proposed Date of Change:
September 13, 1998

Description of Change:
Under the provisions of MIL-PRF-38535, National Semiconductor has moved the process flow location of 100% and group "A" AC/DC testing at -55C and 125C temperature on the FAST logic products.

This change applies to JAN Level B and 883 level FAST devices.

This process modification was fully qualified and approved by the National Semiconductor Technology Review Board.

Effect of Change:
Beginning September 13, 1998, the 100% and Group "A" -55C and 125C AC/DC testing will be performed prior to burn-in for the FAST product family. Group C Operating Life testing will continue in the standard order.

For further questions contact:	North America	Europe
QA Manager	Tel: 408-721-3509 Email: Dennis.Tanguay.@nsc.com	Tel: +49 (0)8141 35-1483 / 1402
PCN Manager	Tel: 408-721-3161 Email: susan.davis@nsc.com	Hi Rel Operations Marketing: Tel: +49 (0)8141 35 1360 Email: Paul.McCormack@nsc.com
Customer Support Center	Tel: 1-800-272-9959 Email: support@nsc.com	Tel: +49 (0)180 530 8585 (German) Tel: +49 (0)180 532 7832 (English) Email: europe.support@nsc.com
Other contacts	Scott Morash Mil/Aero Product Line Engineering (207) 541-8161 email: scott.morash@nsc.com

Other Ref:

Associated Notes / Table(s):

This PCN can also be sent to customers by copying and pasting
the attached PDF file into an email:-