This is to advise you that a Design and/or Process Change will be made to the following High Reliability product(s):

Product ID (Description):
JM38510 B level FACT - SMD (M,B levels) FACT - QB/883 levels FACT

Proposed Date of Change:
JUNE 5, 1996

Description of Change:
ELIMINATION OF -55C TEST
Under the provisions of MIL-PRF-38535, National Semiconductor has eliminated 100% -55 degree DC/AC testing on the JAN 'B' and 883 FACT family, which includes : AC, ACT, ACQ, ACTQ , FCT & SCAN logic products.
This process modification was fully qualified and approved by the National Semiconductor Technology Review Board. Reliability monitors are in place to insure that any potential process variations are detected.

Effect of Change:
Beginning 06-JUN-96, the 100% -55 degree DC/AC test process will be eliminated on the above mentioned devices. Group C QCI testing will continue to include -55 degree DC/AC testing.

For further questions contact:	North America	Europe
QA Manager	Tel: 408-721-3509 Email: Dennis.Tanguay.@nsc.com	Tel: +49 (0)8141 35-1483 / 1402
PCN Manager	Tel: 408-721-3161 Email: susan.davis@nsc.com	Hi Rel Operations Marketing: Tel: +49 (0)8141 35 1360 Email: Paul.McCormack@nsc.com
Customer Support Center	Tel: 1-800-272-9959 Email: support@nsc.com	Tel: +49 (0)180 530 8585 (German) Tel: +49 (0)180 532 7832 (English) Email: europe.support@nsc.com
Other contacts	Bill Petcher Logic Product Eng. 207-775-4597

Other Ref:

Associated Notes / Table(s):

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