This is to advise you that a Design and/or Process Change will be made to the following High Reliability product(s):
Product ID (Description): Logic Families: AC, ACT, ACQ, ACTQ, FCT & SCAN PRODUCTS Proposed Date of Change: OCTOBER 15, 1997 Description of Change: Under the provisions of MIL-PRF-38535, National Semiconductor has moved the process flow location of 100% and group "A" AC/DC testing at 125C temperature on the following logic families (Group C Operating): AC, ACT, ACQ, ACTQ, FCT & SCAN logic products prior to burn-in. Life testing will continue in the standard order. This change does NOT apply to MLS FACT devices with specific customer drawing requirements. This change also does NOT apply to JAN S or QML V devices. This process modification was fully qualified and approved by the National Semiconductor Technology Review Board. Effect of Change: There are no effects to the quality or reliability of these products. These changes will improve continued supply to customers.
Associated Notes / Table(s):
Amended to clarify changes made - The move will take affect PRIOR TO BURN-IN.
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