This is to advise you that a Design and/or Process Change will be made to the following High Reliability product(s):
Product ID (Description): Slashsheet#: JM38510/11006Bxx NSC P/N: JL124
Slasheet#: JM38510/11201Bxx NSC P/N: JL139
See Complete parts list in Table 1
Proposed Date of Change: February 13, 2002
Description of Change: ELIMINATION OF AC TESTING
Under the provisions of MIL-PRF-38535, National Semiconductor has eliminated 100% AC production testing for the JM38510/11005 (JL124), JM38510/11006 (JL124A), and JM38510/11201 (JL139) product families. The 100% screen will be replaced by a standard group "A" sample. This process flow change does not affect space level devices.
This process modification is fully qualified and has been approved by the National Semiconductor Technology Review Board. Reliability monitors are in place to ensure that any potential process variations are detected.
Effect of Change: Beginning February 13, 2002, AC testing will be eliminated on the attached list of devices (Table 1). AC testing will continue as part of our normal QCI coverage.
There will be no negative affects to either the quality or reliability of these product families. This change however, will allow a reduction in processing cycle time.
Associated Notes / Table(s):
TABLE 1
JL124 series: Standard Military Drawing Number or Slasheet Number
JL124ABCA JM38510/11006BCA
JL124ABDA JM38510/11006BDA
JL124ABZA JM38510/11006BZA
JL124BCA JM38510/11005BCA
JL124BDA JM38510/11005BDA
JL124BZA JM38510/11005BZA
JL139 series:
JL139BCA JM38510/11201BCA
JL139BDA JM38510/11201BDA
JL139BZA JM38510/11201BZA
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