This is to advise you that a Design and/or Process Change will be made to the following High Reliability product(s):
Product ID (Description): Voltage References
LM129AH/883 LM129AH-SMD 5962-8992101XA LM129BH/883
Proposed Date of Change: Datecode 0052
Description of Change: Under the provisions of MIL-PRF-38535, National Semiconductor has moved the process flow location of TEMPCO (Temperature Coefficient) testing on the LM129 devices.
This change applies to Level B /883 and Standard Microcircuit Drawing (SMD) devices. This process modification was fully qualified and approved by the National Semiconductor Technology Review Board. Effect of Change: Beginning with datecode 0052, the TEMPCO testing will be performed prior to burn-in for the LM129 devices.
Associated Notes / Table(s):
N/A
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